Title: Multiscale X-ray computed tomography of standard optical fibers Show Chinese title

Title: 标准光学纤维的多尺度X射线计算机断层扫描

Abstract: Optical fiber technologies enable high-speed communication, medical imaging, and advanced sensing. Among the techniques for the characterization of optical fibers, Xray computed tomography has recently emerged as a versatile non-destructive tool for mapping their refractive index variations in 3D. In this study, we present a multiscale characterization of standard optical fibers. We carry out an intercomparison of three tomography setups: classical computed microtomography, X-ray microscopy, and nanotomography. In each method, our analysis highlights the trade-offs between resolution, field of view, and segmentation efficiency. Additionally, we integrate deep learning segmentation thresholding to improve the image analysis process. Thanks to its large field of view, microtomography with classical sources is ideal for the analysis of relatively long fiber spans, where a low spatial resolution is acceptable. The other way around, nanotomography has the highest spatial resolution, but it is limited to very small fiber samples, e.g., fiber tapers and nanofibers, which have diameters of the order of a few microns. Finally, X-ray microscopy provides a good compromise between the sample size fitting the device's field of view and the spatial resolution needed for properly imaging the inner features of the fiber. Specifically, thanks to its practicality in terms of costs and cumbersomeness, we foresee that the latter will provide the most suitable choice for the quality control of fiber drawing in real-time, e.g., using the "One-Minute Tomographies with Fast Acquisition Scanning Technology" developed by Zeiss. In this regard, the combination of X-ray computed tomography and artificial intelligence-driven enhancements is poised to revolutionize fiber characterization, by enabling precise monitoring and adaptive control in fiber manufacturing. Show Chinese abstract

Abstract: 光纤技术使高速通信、医学成像和先进传感成为可能。 在光纤表征的技术中，X射线计算机断层扫描最近作为一种多功能的无损工具出现，用于映射其三维折射率变化。 在本研究中，我们对标准光纤进行了多尺度表征。 我们对三种断层扫描设置进行了相互比较：经典的计算显微断层扫描、X射线显微镜和纳米断层扫描。 在每种方法中，我们的分析突出了分辨率、视野和分割效率之间的权衡。 此外，我们集成了深度学习分割阈值以提高图像分析过程。 由于其较大的视野，使用经典光源的显微断层扫描适用于相对较长的光纤段分析，在这种情况下，较低的空间分辨率是可以接受的。 另一方面，纳米断层扫描具有最高的空间分辨率，但仅限于非常小的光纤样品，例如光纤锥形和纳米纤维，其直径约为几微米。 最后，X射线显微镜在样品尺寸适合设备的视野和用于正确成像光纤内部特征的空间分辨率之间提供了良好的折中。 具体而言，由于其在成本和笨重性方面的实用性，我们预计后者将成为实时光纤拉制质量控制的最合适选择，例如使用蔡司开发的“一分钟断层扫描快速采集扫描技术”。 在这方面，X射线计算机断层扫描与人工智能驱动的增强相结合，有望通过实现精确监测和自适应控制来彻底改变光纤表征。