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十九世纪,莫斯托蒂和克劳修斯提出了一个表达式,将电介质的介电常数与分子极化率和数密度的乘积联系起来。 洛伦兹和洛伦兹将该表达式的用途扩展到也涵盖电介质的折射率。 这些表达式成功地预测了介电常数和折射率随数密度变化的情况,前提是假设分子极化率不会发生显著变化。 然而,这些方程的推导基于对球形空腔内电场的近似处理,该空腔用于模拟去除单个分子自身场后的环境。 切换到精确的场解扩展了克劳修斯-莫斯托蒂方程和洛伦兹-洛伦兹方程的有效性范围,使其适用于致密化电介质中出现的更高数密度值。 它还显著改变了对分子极化率的估算。
In the 19th century Mossotti and Clausius formulated an expression that relates electrical permittivity of a dielectric to the product of molecular polarizability and number density. Lorenz and Lorentz extended the use of that expression to also cover the dielectric s refractive index. These expressions successfully predict the change of the dielectric s permittivity and refractive index as a function of a wide range of its number density, using the consideration that molecular polarizability should not change significantly. However, the derivation of these equations is based on an approximation of the electric field inside the spherical void that models the environment of a single molecule with its own field removed. A switch to the exact field solution extends the validity of the Clausius-Mossotti and Lorentz-Lorenz equations to the higher values of number density which occur in densified dielectrics. It also provides a significant change in the estimates of molecular polarizability.