标题： 环形X射线光学器件为辐射敏感样本提供了更高的分辨率。 显示英文标题

标题： Annular x-ray optics offer superior resolution for radiation sensitive samples

摘要： 高分辨率X射线显微镜需要高光子通量来测量来自弱散射样本的信号。这使样本暴露于高辐射剂量下，可能导致通过辐射损伤损害或破坏它们。在这项工作中，我们提出在扫描显微镜中使用环形光学器件作为全孔径光学器件的替代方案。环形光学器件充当高通滤波器。与具有相同数值孔径的常规光学器件相比，环形光学器件在产生相同的小样本特征信号的同时，使样本暴露的剂量更少。环形光学器件从最新的X射线源提供的高光子通量中显著受益，以补偿其总体较小的截面。使用数值模拟，我们展示了对于接近光学器件分辨率极限的样本特征，环形光学器件提供了优越的光学性能。 显示英文摘要

摘要： High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damaging or destroying them through radiation damage. In this work, we propose the use of annular optics in scanning microscopy as an alternative to full-aperture optics. Annular optics act as high-pass filters. Compared to regular optics with the same numerical aperture, annular optics expose the sample to less dose while producing the same signal from small sample features. Annular optics benefit significantly from the high photon fluxes of the latest x-ray sources to compensate for their overall smaller cross section. Using numerical simulations, we show that annular optics offer superior optical performance for sample features close to the resolution limit of the optic.