标题： 氙中间层对铂基底上氘化甲烷解离电子附着的影响 显示英文标题

标题： Influence of a Xenon interlayer on dissociative electron attachment to deuterated methane on a platinum substrate

摘要： 我们研究了在两层单分子（ML）的凝聚CD4薄膜和铂表面之间插入氙层对解离电子附着（DEA）的影响。 观察到的脱附结果与密度泛函理论（DFT）计算进行了比较，这些计算揭示了各种阴离子和中性物种的结合能作为氙层厚度的函数在Pt（111）基底上的变化。 理论结果表明，6 ML的氙足以消除表面效应，使物理吸附的阴离子碎片从CD4薄膜中脱附。 相比之下，实验上需要20 ML（约10 nm）才能实现D-脱附的饱和。 此外，氙层的存在使得共振态与氙激发态耦合，从而抑制电子返回金属。 除了减少表面相互作用外，氙中间层显著增强了对CD4的DEA。 显示英文摘要

摘要： We investigate the impact of intercalating a xenon layer between a thin condensed CD4 film of two monolayers (ML) and a platinum surface on the dissociative electron attachment (DEA). The observed desorption results are compared with density functional theory (DFT) calculations, which reveal the binding energies of various anionic and neutral species as a function of the xenon film thickness on the Pt (111) substrate. The theoretical results suggest that 6 ML of xenon are sufficient to diminish the surface effect, enabling physisorbed anionic fragments to desorb from the CD4 film. In contrast, 20 ML (approximately 10 nm) are experimentally necessary to achieve saturation in the desorption of D-. In addition, the presence of xenon layers enables the coupling of resonance states with Xe excited states, thereby inhibiting the electrons from returning to the metal. Aside from reducing surface interactions, the xenon interlayer significantly enhances DEA to CD4.