标题： 扭曲双层石墨烯的光电子衍射 显示英文标题

标题： Photoelectron diffraction of twisted bilayer graphene

摘要： 光电子衍射（PED）是一种强大的光谱技术，它结合了元素分辨率和对晶体表面局部原子排列的高度敏感性，从而提供了物质中选定原子位点的独特特征指纹。 受用于探测二维材料范德华（vdW）异质结构的原子和电子结构的各种分析方法快速发展的推动，我们对PED提取结构特性（如堆叠方式、扭转角度和层间距离）的能力进行了理论评估。 我们通过计算和分析Bernal堆叠和AA堆叠以及具有广泛扭转角度的扭转双层石墨烯的PED，对基准vdW异质结构双层石墨烯（BLG）进行了完整的描述。 显示英文摘要

摘要： Photoelectron diffraction (PED) is a powerful spectroscopic technique that combines elemental resolution with a high sensitivity to the local atomic arrangement at crystal surfaces, thus providing unique fingerprints of selected atomic sites in matter. Stimulated by the rapid innovation in the development of various analysis methods for probing the atomic and electronic structures of van der Waals (vdW) heterostructures of two-dimensional materials, we present a theoretical assessment of the capacity of PED for extracting structural properties such as stacking, twist angles and interlayer distances. We provide a complete description of PED for the benchmark vdW heterostructure bilayer graphene (BLG), by calculating and analyzing the PED of BLG in Bernal and AA-stacking as well as twisted BLG for a wide range of the twist angle.