标题： 扫描透射电子显微镜中损伤扩散分布的快速模拟 显示英文标题

标题： Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy

摘要： 扫描透射电子显微镜（STEM）是用于在原子尺度成像材料和生物样本特性的关键工具，但对我们相关电子束损伤机制的理解仍然不完整。 最近的研究表明，某些类型的损伤可以建模为扩散过程。 然而，此类扩散过程的数值模拟仍然计算量大。 本研究引入了一个高性能的C++框架，用于模拟STEM中的损伤扩散过程，该框架结合了高效的数值计算、先进的可视化和多线程技术，在保持准确性的同时实现了高效的运行时间。 显示英文摘要

摘要： Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent studies suggest that certain types of damage can be modelled as a diffusion process. However, numerical simulation of such diffusion processes has remained computationally intensive. This work introduces a high-performance C++ framework for simulating damage diffusion process in STEM that combines efficient numerical computation, advanced visualisations, and multithreading to achieve efficient runtime while maintaining accuracy.