标题： 用于反铁电体的新型电学表征方法，采用正向上负向下方法 显示英文标题

标题： Novel Electrical Characterization Method for Antiferroelectrics using a Positive Up Negative Down Approach

摘要： 本研究展示了AFE-PUND的有效性，这是一种重新审视的正向负向（PUND）协议，用于表征反铁电（AFE）材料，在分析不同厚度的$ZrO_2$薄膜时揭示了关键趋势。提出的AFE-PUND方法能够将开关电流与非开关贡献分离，从而从滞后回线中精确提取剩余极化和矫顽场。剩余极化随着薄膜厚度的增加而增加，反映了增强的畴稳定性，而耐久循环突显了唤醒效应及其在较厚薄膜中的疲劳导致的最终退化。同样，矫顽场随厚度减小，表明开关势垒降低以及四方相和正交相之间更清晰的转变。该方法提供了关于微观结构影响的重要见解，例如缺陷积累、晶粒大小和畴壁钉扎，这些因素对器件性能有关键影响。因此，AFE-PUND确立了其作为推进反铁电材料理解和优化的重要工具的地位。 显示英文摘要

摘要： This study demonstrates the effectiveness of AFE-PUND, a revisited Positive Up Negative Down (PUND) protocol for characterizing antiferroelectric (AFE) materials, in analyzing $ZrO_2$ films across different thicknesses, revealing key trends. The proposed AFE-PUND method enables the isolation of switching currents from non-switching contributions, allowing precise extraction of remanent polarization and coercive field from hysteresis loops. The remanent polarization increases with film thickness, reflecting enhanced domain stability, while endurance cycles highlight the wake-up effect and its eventual degradation due to fatigue in thicker films. Similarly, coercive fields decrease with thickness, indicating reduced switching barriers and a clearer transition between tetragonal and orthorhombic phases. The method provides valuable insights into micro-structural influences, such as defect accumulation, grain size, and domain wall pinning, which critically affect device performance. AFE-PUND thus establishes itself as an essential tool for advancing the understanding and optimization of antiferroelectric materials.