标题： 干涸过程中薄胶体薄膜中的裂纹图案的表观模型 显示英文标题

标题： Phenomenological model of crack patterns in thin colloidal films undergoing desiccation

摘要： 对基于裂纹模板的导电薄膜样本的若干几何和拓扑性质进行了研究，以评估Voronoi图在这样的网络中成功建模结构和导电性的程度。 我们的分析表明，尽管泊松-Voronoi图在建模干燥过程中形成的现实世界裂纹图案的结构特征方面仅部分成功，但这些图在拓扑特性比几何特性更重要的情况下仍然有用。 提出了一种现象学模型，该模型在捕捉现实世界裂纹图案特征方面更为准确。 显示英文摘要

摘要： A number of geometric and topological properties of samples of crack-template based conductive films are examined to assess the degree to which Voronoi diagrams can successfully model structure and conductivity in such networks. Our analysis suggests that although Poisson--Voronoi diagrams are only partially successful in modeling structural features of real-world crack patterns formed in films undergoing desiccation, such diagrams can nevertheless be useful in situations where topological characteristics are more important than geometric ones. A phenomenological model is proposed that is more accurate at capturing features of the real-world crack patterns.