标题： 关于离焦电子叠层相衬术中的重叠比 显示英文标题

标题： On Overlap Ratio in Defocused Electron Ptychography

摘要： 使用离焦电子探针获取数据的四维扫描透射电子显微镜（4D STEM）是一种通过称为电子叠层术（EP）的相位恢复过程表征复杂生物样本和材料的有前途的工具。 4D STEM 获取的有效性以及由此产生的 EP 重建质量取决于相邻照明区域的重叠比。 本文展示了重叠比如何影响数据冗余和 EP 重建的质量。 我们定义了两个与重叠比有关且独立于对象和 EP 算法的量。 随后，我们使用模拟的 4D STEM 数据集评估了不同重叠比下的 EP 算法。值得注意的是，40% 或更高的重叠比可以产生稳定且高质量的重建。 显示英文摘要

摘要： Four-dimensional Scanning Transmission Electron Microscopy (4D STEM) with data acquired using a defocused electron probe is a promising tool for characterising complex biological specimens and materials through a phase retrieval process known as Electron Ptychography (EP). The efficacy of 4D STEM acquisition and the resulting quality of EP reconstruction depends on the overlap ratio of adjacent illuminated areas. This paper demonstrates how the overlap ratio impacts the data redundancy and the quality of the EP reconstruction. We define two quantities as a function of the overlap ratio that are independent of both the object and the EP algorithm. Subsequently, we evaluate an EP algorithm for varying overlap ratios using simulated 4D STEM datasets. Notably, a 40% or greater overlap ratio yields stable, high-quality reconstructions.