标题： 基于RFSoC和定制模拟前端的超导电子测试用时标数据采集系统 显示英文标题

标题： Time-tagging data acquisition system for testing superconducting electronics based on an RFSoC and custom analog frontend

摘要： 新型电子设备通常可以以多种方式运行，这使得测试由它们组成的电路变得困难。通常，没有单一工具能够同时分析电路的操作裕度、最大速度和失效模式，特别是在电路子组件的预期行为未标准化的情况下。 本文展示了一种用于电子电路的成本效益数据采集系统，该系统支持比传统实验设置更复杂的验证技术。我们使用高速数模转换器和实时多千兆样本/秒波形处理来推动实验电路超出其最大操作速度。 我们的自定义时间标记数据捕获固件减少了内存需求，并可用于确定错误发生的时间。该固件与具有超过$50\,\mathrm{dB}$动态范围的热噪声限制模拟前端结合使用。 与目前可用的商业测试设备相比，此数据采集系统能够在近三倍于当前时钟频率（$200\,\mathrm{MHz}$对$80\,\mathrm{MHz}$）下操作超导移位寄存器，而成本仅为约七分之一。 显示英文摘要

摘要： Novel electronic devices can often be operated in a plethora of ways, which makes testing circuits comprised of them difficult. Often, no single tool can simultaneously analyze the operating margins, maximum speed, and failure modes of a circuit, particularly when the intended behavior of subcomponents of the circuit is not standardized. This work demonstrates a cost-effective data acquisition system for electronic circuits that enables more intricate verification techniques than are practical with conventional experimental setups. We use high-speed digital-to-analog converters and real-time multi-gigasample-per-second waveform processing to push experimental circuits beyond their maximum operating speed. Our custom time-tagging data capture firmware reduces memory requirements and can be used to determine when errors occur. The firmware is combined with a thermal-noise-limited analog frontend with over $50\,\mathrm{dB}$ of dynamic range. Compared to currently available commercial test equipment, this data acquisition system was able to operate a superconducting shift register at a nearly three-times-higher clock frequency ($200\,\mathrm{MHz}$ vs. $80\,\mathrm{MHz}$) at roughly one seventh the cost.