标题： 基于RFSoC和定制模拟前端的超导电子测试用时标数据采集系统 显示英文标题

标题： Time-tagging data acquisition system for testing superconducting electronics based on an RFSoC and custom analog frontend

摘要： 新型电子设备通常可以以多种方式运行，这使得测试由它们组成的电路变得困难。通常，没有单一工具能够同时分析电路的操作范围、最大速度和故障模式，特别是在电路的子组件预期行为未标准化的情况下。 本工作展示了一种用于电子电路的成本效益数据采集系统，该系统使验证技术比传统实验设置更复杂成为可能。我们使用高速数模转换器和实时多吉萨姆每秒波形处理来推动实验电路超出其最大操作速度。 我们的自定义时间标记数据捕获固件减少了内存需求，并可用于确定错误发生的时间。该固件与具有超过$50\,\mathrm{dB}$动态范围的热噪声限制模拟前端结合使用。 与目前可用的商业测试设备相比，该数据采集系统能够在近三倍于时钟频率（$200\,\mathrm{MHz}$对比$80\,\mathrm{MHz}$）的情况下操作超导移位寄存器，且成本仅为约七分之一。 显示英文摘要

摘要： Novel electronic devices can often be operated in a plethora of ways, which makes testing circuits comprised of them difficult. Often, no single tool can simultaneously analyze the operating margins, maximum speed, and failure modes of a circuit, particularly when the intended behavior of subcomponents of the circuit is not standardized. This work demonstrates a cost-effective data acquisition system for electronic circuits that enables more intricate verification techniques than are practical with conventional experimental setups. We use high-speed digital-to-analog converters and real-time multi-gigasample-per-second waveform processing to push experimental circuits beyond their maximum operating speed. Our custom time-tagging data capture firmware reduces memory requirements and can be used to determine when errors occur. The firmware is combined with a thermal-noise-limited analog frontend with over $50\,\mathrm{dB}$ of dynamic range. Compared to currently available commercial test equipment, this data acquisition system was able to operate a superconducting shift register at a nearly three-times-higher clock frequency ($200\,\mathrm{MHz}$ vs. $80\,\mathrm{MHz}$) at roughly one seventh the cost.