标题： 通过μ子断层扫描探测宇宙射线成分和μ子亲合暗物质 显示英文标题

标题： Probing Cosmic Ray Composition and Muon-philic Dark Matter via Muon Tomography

摘要： 这项工作介绍了一种新的宇宙射线散射实验，采用电阻板室（RPC）μ子断层扫描系统。通过引入入射和出射宇宙射线轨迹之间的散射角作为关键可观测量，这种方法能够同时研究次级宇宙射线成分并寻找新物理现象。在63天的活动中，记录并分析了118万次宇宙射线散射事件。通过对观测到的角度分布进行联合模板拟合，测定了粒子丰度，例如，在$\sim 2\%$精度下解析电子成分。此外，对μ子亲和型暗物质的弹性μ子-暗物质（DM）散射截面建立了约束。在95%的置信水平下，限制达到1.62 $\times$ $10^{-17}$ $\rm{cm}^{2}$ 对于1 GeV慢暗物质，展示了对轻量级μ子耦合慢暗物质的灵敏度极限。 显示英文摘要

摘要： This work presents a novel cosmic-ray scattering experiment employing a Resistive Plate Chambers (RPC) muon tomography system. By introducing the scattering angle between incident and outgoing cosmic-ray tracks as a key observable, this approach enables simultaneous studies of secondary cosmic-ray composition and searching for new physics. During a 63-day campaign, 1.18 million cosmic ray scattering events were recorded and analyzed. By performing combined template fits to the observed angular distribution, particle abundances are measured, for example, resolving the electron component at $\sim 2\%$ precision. Furthermore, constraints are established on elastic muon-dark matter (DM) scattering cross-sections for muon-philic dark matter. At the 95\% confidence level, the limit reaches 1.62 $\times$ $10^{-17}$ $\rm{cm}^{2}$ for 1 GeV slow DM, demonstrating sensitivity limit to light muon-coupled slow DM.