标题： 基于隧穿力显微镜的原子分辨率、单自旋磁共振检测概念 显示英文标题

标题： An atomic resolution, single-spin magnetic resonance detection concept based on tunneling force microscopy

摘要： 对具有原子空间分辨率的力检测单自旋磁共振测量概念进行全面研究。 该方法基于静电力检测，在两个电隔离的顺磁态之间的自旋选择规则控制的单电子隧穿。 通过测量自旋共振前后力检测的隧穿电荷噪声，可以实现单自旋磁共振检测。 基于隧穿和自旋物理的物理模型的这种电荷噪声的仿真结果直接与测量的AFM系统噪声进行比较。 结果表明，该方法可以在室温下以原子空间分辨率提供电隔离量子比特状态的单自旋测量。 显示英文摘要

摘要： A comprehensive study of a force detected single-spin magnetic resonance measurement concept with atomic spatial resolution is presented. The method is based upon electrostatic force detection of spin-selection rule controlled single-electron tunneling between two electrically isolated paramagnetic states. Single spin magnetic resonance detection is possible by measuring the force detected tunneling charge noise on and off spin resonance. Simulation results of this charge noise, based upon physical models of the tunneling and spin physics, are directly compared to measured AFM system noise. The results show that the approach could provide single spin measurement of electrically isolated qubit states with atomic spatial resolution at room temperature.