标题： 多功能原子力显微镜装置与微聚焦X射线束相结合 显示英文标题

标题： Versatile AFM setup combined with micro-focused X-ray beam

摘要： 以第三代同步辐射源产生的微聚焦X射线束为特点，为在纳米尺度上研究应变和过程提供了新的视角。 结合微聚焦同步辐射束的原子力显微镜装置，能够在光照下精确定位和纳米操作纳米结构。 在本文中，我们报告了将便携式商用原子力显微镜装置集成到硬X射线同步辐射光束线上的情况。 介绍了装置的设计细节、样品对准程序和性能。 显示英文摘要

摘要： Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented.