标题： 氖中超短X射线脉冲的正常俄歇过程 显示英文标题

标题： Normal Auger processes with ultrashort x-ray pulses in Neon

摘要： 现代X射线源能够产生相干X射线脉冲，其脉冲持续时间与原子和分子的内层空穴态的特征寿命处于同一数量级。 这些脉冲能够在俄歇衰变过程中操控内层空穴的种群，从而改变电子能谱的线形。 在本工作中，我们提出一个理论模型来研究氖中的这些效应。 我们识别了由于脉冲持续时间和强度而在俄歇-光电子符合谱中产生的效应。 在所有光电子能量积分后的俄歇电子能谱中，正常的俄歇线形得以恢复。 显示英文摘要

摘要： Modern x-ray sources enable the production of coherent x-ray pulses with a pulse duration in the same order as the characteristic lifetimes of core-hole states of atoms and molecules. These pulses enable the manipulation of the core-hole population during Auger decay processes, modifying the lineshape of the electron spectra. In this work, we present a theoretical model to study those effects in Neon. We identify effects in the Auger-photoelectron coincidence spectrum due to the duration and intensity of the pulses. The normal Auger line-shape is recovered in Auger electron spectrum integrated over all photoelectron energies.