标题： 天文应用的弯曲探测器：不同样品的特性测试结果 显示英文标题

标题： Curved detectors for astronomical applications:characterization results on different samples

摘要： 由于未来天文巡天的维度、复杂性和成本不断增加，需要新的技术来实现更加紧凑和简单的系统。 曲面探测器的发展允许增强所用光学系统的性能（望远镜或天文仪器），同时保持系统更紧凑。 我们在这里描述了由CEA-LETI和CNRS-LAM之间的合作开发的一组五个曲面CMOS探测器。 这些完全功能的探测器（20 Mpix，CMOSIS CMV20000）已被弯曲到不同的曲率半径和球面形状（凸面和凹面），尺寸为24x32 mm²。 在能够用于天文观测之前，我们评估了弯曲过程对其性能的影响。 我们对曲面探测器进行了完整的光电特性表征，测量了增益、满阱容量、动态范围和噪声特性，如暗电流、读出噪声、像素相对非均匀性。 我们对同一CMOS传感器的平面版本也进行了相同的过程，作为比较的参考。 我们发现大多数测试值在曲面和平面样品之间没有显著差异。 与平面样本的11e$^-$相比，曲面样本的读出噪声为10e$^-$，这使得曲面探测器具有稍大的动态范围。 此外，我们测量到的暗电流值始终比平面CMOS传感器小。 本文展示的原型探测器的弯曲过程不会显著影响探测器的性能。 这些结果代表了它们在天文应用中的第一步。 显示英文摘要

摘要： Due to the increasing dimension, complexity and cost of the future astronomical surveys, new technologies enabling more compact and simpler systems are required. The development of curved detectors allows to enhance the performances of the optical system used (telescope or astronomical instrument), while keeping the system more compact. We describe here a set of five curved CMOS detectors developed within a collaboration between CEA-LETI and CNRS-LAM. These fully-functional detectors 20 Mpix (CMOSIS CMV20000) have been curved to different radii of curvature and spherical shapes (both convex and concave) over a size of 24x32 mm^2. Before being able to use them for astronomical observations, we assess the impact of the curving process on their performances. We perform a full electro-optical characterization of the curved detectors, by measuring the gain, the full well capacity, the dynamic-range and the noise properties, such as dark current, readout noise, pixel-relative-non-uniformity. We repeat the same process for the flat version of the same CMOS sensor, as a reference for comparison. We find no significant difference among most of the characterization values of the curved and flat samples. We obtain values of readout noise of 10e$^-$ for the curved samples compared to the 11e$^-$ of the flat sample, which provides slightly larger dynamic ranges for the curved detectors. Additionally we measure consistently smaller values of dark current compared to the flat CMOS sensor. The curving process for the prototypes shown in this paper does not significantly impact the performances of the detectors. These results represent the first step towards their astronomical implementation.