标题： 大格式反射光栅原型在亚轨道火箭载荷中的性能测试 显示英文标题

标题： Performance Testing of a Large-Format Reflection Grating Prototype for a Suborbital Rocket Payload

摘要： 软X射线光栅光谱仪搭载在离轴光栅火箭实验（OGRE）上，希望在通过亚轨道火箭发射时能够获得天体物理物体的最高分辨率软X射线光谱。光谱仪的成功关键在于其反射光栅组件中$>250$反射光栅的性能。为了测试当前光栅制造能力，payload的光栅原型在宾夕法尼亚州立大学材料研究学院通过电子束光刻技术制造，并随后在马克斯·普朗克外星物理研究所的PANTER X射线测试设施进行了性能测试。通过马尔可夫链蒙特卡罗（MCMC）采样对结果数据进行贝叶斯建模表明，在94%的置信水平下，光栅达到了OGRE单光栅分辨率要求的$R_{g}(\lambda/\Delta\lambda)>4500$。结果的$R_g$后验概率分布表明，这个置信水平可能是一个保守估计，因为只采样了有限的$R_g$参数空间，且模型无法将$R_g$的上限约束到无穷大以下。系统的光线追踪模拟发现，观察到的数据可以用一个性能达到$R_g=\infty$的光栅来重现。 因此假设获得的$R_g$后验概率分布的行为可以由系统的有限测量极限来解释，而不是$R_g$的有限极限。 这些结果的含义和测试设置的改进进行了讨论。 显示英文摘要

摘要： The soft X-ray grating spectrometer on board the Off-plane Grating Rocket Experiment (OGRE) hopes to achieve the highest resolution soft X-ray spectrum of an astrophysical object when it is launched via suborbital rocket. Paramount to the success of the spectrometer are the performance of the $>250$ reflection gratings populating its reflection grating assembly. To test current grating fabrication capabilities, a grating prototype for the payload was fabricated via electron-beam lithography at The Pennsylvania State University's Materials Research Institute and was subsequently tested for performance at Max Planck Institute for Extraterrestrial Physics' PANTER X-ray Test Facility. Bayesian modeling of the resulting data via Markov chain Monte Carlo (MCMC) sampling indicated that the grating achieved the OGRE single-grating resolution requirement of $R_{g}(\lambda/\Delta\lambda)>4500$ at the 94% confidence level. The resulting $R_g$ posterior probability distribution suggests that this confidence level is likely a conservative estimate though, since only a finite $R_g$ parameter space was sampled and the model could not constrain the upper bound of $R_g$ to less than infinity. Raytrace simulations of the system found that the observed data can be reproduced with a grating performing at $R_g=\infty$. It is therefore postulated that the behavior of the obtained $R_g$ posterior probability distribution can be explained by a finite measurement limit of the system and not a finite limit on $R_g$. Implications of these results and improvements to the test setup are discussed.