标题： 量子态层析作为双层问题，利用I-Q平面数据 显示英文标题

标题： Quantum State Tomography as a Bilevel Problem, Utilizing I-Q Plane Data

摘要： 自然地会问如何利用实际测量，例如在transmon量子比特的色散读出中获得的所谓IQ平面数据，来估计量子系统的状态。 我们将区分和量子态层析的联合问题表述为一个双层优化问题，并展示如何解决它。 与传统技术相比，传统技术将问题分解为基于某些投影测量算子期望值的区分和量子态层析，联合问题的使用可以提高样本复杂度（或在固定测量数量下的重建误差）。 显示英文摘要

摘要： It is natural to ask how to utilize actual measurements, such as the so-called IQ-plane data obtained in the dispersive readout of transmon qubits, in the estimation of the state of a quantum system. We formulate the joint problem of discrimination and quantum state tomography as a bilevel optimization problem and show how to solve it. The use of the joint problem can improve the sample complexity (or the reconstruction error for a fixed number of measurements) compared with traditional techniques that decompose the problem into the discrimination and state tomography based on the estimated expectation values of certain projective measurement operators.