标题： 快速散斑波长计的设计与光学处理 显示英文标题

标题： Design of a fast speckle wavemeter with optical processing

摘要： 我们提出了一种基于斑点的波长计的设计概念，该设计结合了高光谱分辨率和快速响应时间。 我们的装置使用具有小相干长度的固定色散介质作为光学预处理器，以及一系列可编程光学元件作为后处理器。 预处理器生成具有给定相关长度的复杂斑点图案，然后后处理器将光场转换为强度与参考值的波长偏差成比例的简单二进制图案。 我们展示了如何构建一个可以在平衡探测器上产生与波长成比例的电信号的装置。 此外，我们证明了当预处理器的相关长度在皮米范围内时，该装置可以从亚皮米到纳米级分辨率工作。 更一般地，我们的结果表明，通过使用具有较高分辨率的固定预处理器，可以增强使用低光谱分辨率的可编程光学后处理器的效果。 显示英文摘要

摘要： We present a design concept for a speckle based wavemeter that combines high spectral resolution and fast response times. Our device uses a fixed disperse medium with small coherence length as an optical pre-processor and a series of programmable optical elements as post-processor. The pre-processor generates a complex speckle pattern with a given correlation length, then the post-processor transforms the optical field to a simple binary pattern with intensity proportional to the wavelength deviation from a reference value. We show how to construct a device which can be trained to produce an electrical signal on a balanced detector proportional to the wavelength. Also, we demonstrate that the device can operate from sub-picometer up to nanometer resolution using a pre-processor with correlation length in the picometer range. More generally, our results show how the use of a programmable optical post-processor with low spectral resolution can be enhanced by a fixed pre-procesor with a higher one.