标题： 用于暗物质探测的p型点接触锗探测器中康普顿散射的测量 显示英文标题

标题： Measurement of the Compton scattering in germanium with a p-type point-contact germanium detector for dark matter detection

摘要： 通过环境$\gamma$射线的康普顿散射产生的低能本底可能在直接暗物质搜索实验中受到污染。 在本文中，我们报告了通过几种$\gamma$射线源的康普顿散射对低能谱的可比较测量结果，使用的是p型点接触锗探测器。 500 eV到18 keV之间的谱已进行了测量和分析。 此外，通过不同的伽马源观察到了电子结合效应的特征，特别是在锗原子的K壳层和L壳层边缘，并与Geant4模拟中的模型一致。 提出了一种经验性本底模型，该模型为理解直接暗物质实验中锗的低能本底提供了见解。 显示英文摘要

摘要： Low-energy background through Compton scattering from the ambient $\gamma$ rays can be contaminated in direct dark matter search experiments. In this paper, we report comparable measurements on low-energy spectra via Compton scattering from several $\gamma$-ray sources with a p-type point-contact germanium detector. The spectra between 500 eV and 18 keV have been measured and analyzed. Moreover, the features of the electron binding effect, particularly at the edges of the K- and L-shells in the germanium atom, were observed with different gamma sources and were consistent with the models in the Geant4 simulation. An empirical background model is proposed that provides insights into understanding the low-energy background in germanium for direct dark matter experiments.