标题： 推进紫外探测器技术以服务于未来的任务：使用光子计数EMCCD研究硅探测器中的暗电流平台 显示英文标题

标题： Advancing Ultraviolet Detector Technology for future missions: Investigating the dark current plateau in silicon detectors using photon-counting EMCCDs

摘要： 理解由喷气推进实验室微器件实验室开发的高量子效率硅基紫外探测器的噪声特性，对于目前和计划中的使用这些设备的紫外任务而言至关重要。 本文概述了我们用于探测器噪声表征的测试平台，该平台利用了delta掺杂、光子计数型电子倍增电荷耦合器件（EMCCD），以了解与所有硅基CCD和CMOS阵列相关的根本噪声属性。 这项工作试图确定之前用光子计数EMCCD测量到的暗电流平台的来源，并且已知这种平台在其他基于硅的阵列中普遍存在。 怀疑该平台可能是由于可检测到的环境仪器黑体辐射尾部中的光子、低水平的漏光以及与衬底电压有关而非温度依赖的成分共同引起的。 我们的创新测试设置通过独立控制探测器和周围环境的温度，区分了暗测量过程中环境的影响。 我们介绍了测试设置的设计和初步结果。 显示英文摘要

摘要： Understanding the noise characteristics of high quantum efficiency silicon-based ultraviolet detectors, developed by the Microdevices Lab at the Jet Propulsion Laboratory, is critical for current and proposed UV missions using these devices. In this paper, we provide an overview of our detector noise characterization test bench that uses delta-doped, photon counting, Electron-multiplying CCDs (EMCCDs) to understand the fundamental noise properties relevant to all silicon CCDs and CMOS arrays. This work attempts to identify the source of the dark current plateau that has been previously measured with photon-counting EMCCDs and is known to be prevalent in other silicon-based arrays. It is suspected that the plateau could be due to a combination of detectable photons in the tail of blackbody radiation of the ambient instrument, low-level light leaks, and a non-temperature-dependent component that varies with substrate voltage. Our innovative test setup delineates the effect of the ambient environment during dark measurements by independently controlling the temperature of the detector and surrounding environment. We present the design of the test setup and preliminary results.