标题： 多尺度结构分析的定量方法与原子分辨率电子显微镜 显示英文标题

标题： Quantitative approaches for multi-scale structural analysis with atomic resolution electron microscopy

摘要： 原子分辨率成像通过扫描透射电子显微镜是表征材料纳米尺度结构的强大工具，特别是对于缺陷、局部应变和对称性破缺畸变等特征。 除了先进的仪器外，该技术的有效性还依赖于计算图像分析，以从实验中记录的复杂数据集中提取有意义的特征，这些数据可能因噪声和伪影、小尺寸或重叠特征以及需要在大范围代表性区域上扩展分析而变得复杂。 在此，我们介绍了结合实空间和倒易空间信息的图像分析方法，能够高效可靠地从原子分辨率电子显微镜图像中获得皮米尺度精度的结构信息，覆盖数百纳米的材料区域。 在倒易空间中对超结构峰进行阻尼，可以将对称性破缺的结构畸变与其他不均匀性来源区分开，并以高精度进行测量。 通过对傅里叶滤波产生的波状信号进行实空间拟合，可以绝对量化晶格参数的变化和应变，以及这些测量的相关不确定性。 这些算法的实现作为开源 Python 包提供。 显示英文摘要

摘要： Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions. In addition to advanced instrumentation, the effectiveness of the technique depends on computational image analysis to extract meaningful features from complex datasets recorded in experiments, which can be complicated by the presence of noise and artifacts, small or overlapping features, and the need to scale analysis over large representative areas. Here, we present image analysis approaches which synergize real and reciprocal space information to efficiently and reliably obtain meaningful structural information with picometer scale precision across hundreds of nanometers of material from atomic-resolution electron microscope images. Damping superstructure peaks in reciprocal space allows symmetry-breaking structural distortions to be disentangled from other sources of inhomogeneity and measured with high precision. Real space fitting of the wave-like signals resulting from Fourier filtering enables absolute quantification of lattice parameter variations and strain, as well as the uncertainty associated with these measurements. Implementations of these algorithms are made available as an open source Python package.