标题： 费米子平均电路本征值采样 显示英文标题

标题： Fermionic Averaged Circuit Eigenvalue Sampling

摘要： 费米子平均电路本征值采样（FACES）是一种协议，可以从适合的费米子线性光学（FLO）电路集合中同时且自洽地学习许多费米子线性光学（FLO）门的平均错误率。 它具有高度的灵活性，允许在对连续参数化的一和两个量子比特门族做出自然假设的情况下，在现场表征FLO平均门依赖性噪声。 我们严格证明了我们的协议具有高效的采样复杂度，这在一定程度上归功于我们在分析中涉及的Kravchuk变换的有用性质。 我们通过数值结果支持我们的结论。 由于FLO电路在访问某些资源态时变得通用，我们期望我们的结果能够为自然具有费米子描述的通用量子计算架构上的噪声表征和误差缓解技术提供指导。 显示英文摘要

摘要： Fermionic averaged circuit eigenvalue sampling (FACES) is a protocol to simultaneously learn the averaged error rates of many fermionic linear optical (FLO) gates simultaneously and self-consistently from a suitable collection of FLO circuits. It is highly flexible, allowing for the in situ characterization of FLO-averaged gate-dependent noise under natural assumptions on a family of continuously parameterized one- and two-qubit gates. We rigorously show that our protocol has an efficient sampling complexity, owing in-part to useful properties of the Kravchuk transformations that feature in our analysis. We support our conclusions with numerical results. As FLO circuits become universal with access to certain resource states, we expect our results to inform noise characterization and error mitigation techniques on universal quantum computing architectures which naturally admit a fermionic description.