标题： 太空中的软错误率：一种统一的分析方法 显示英文标题

标题： Soft Error Rate in Space: A Unified Analytical Approach

摘要： 提出了一种基于物理的新模型，用于分析计算数字存储电路在空间轨道受重离子影响时的软错误率（SER）。 该方法基于从正常离子入射地面测试结果中唯一确定的参数。 研究表明，在标准反余弦模型内对总立体角进行初步平均可以考虑各向同性流的影响，这会增加有效的SER。 该模型包括评估低LET谱区域对SER贡献的能力，这对于单事件扰动容限较低的现代集成电路非常重要。 显示英文摘要

摘要： A new physics-based model for analytical calculation of Soft Error Rate (SER) in digital memory circuits under the influence of heavy ions in space orbits is proposed. This method is based on parameters that are uniquely determined from the results of ground tests under nor-mal ion incidence. It is shown that preliminary averaging over the total solid angle within the standard inverse cosine model allows one to take into account the effect of isotropic flow, which increases the effective SER. The model includes the ability to estimate the contribution to SER of the low LET spectrum region, which is very important for modern ICs with low Single Event Upset tolerance.