标题： 二维片材中多通道 I-V 测量的探针位置确定$\colon$计算方法和数学分析 显示英文标题

标题： Probe position determination with multichannel I-V measurements in a two-dimensional sheet$\colon$ Computational method and mathematical analysis

摘要： 原子薄层薄膜和表面表现出许多在体晶体中不存在的独特二维电子特性。原位微尺度多探针测量已被用作一种有效的方法，以确定这种薄层薄膜和表面的电导率。精确确定多探针位置对于准确表征电导率至关重要。然而，传统方法使用显微镜来确定多探针位置，通常会对实验装置施加重大限制。在某些情况下，安装显微镜甚至不可行。因此，在本研究中，我们提出了一种新方法，利用探针的电信号来确定探针位置。该方法即使在低温或高温以及超高真空或高压条件下，也能使用参考片和参考探针精确确定探针位置。所提出的方法简化了微尺度多探针测量系统在各种设备中的集成，从而推动了对薄层薄膜和表面的研究。 显示英文摘要

摘要： Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the electrical conductivity of such thin films and surfaces. Precise determination of multi-probe positions is crucial for accurate characterization of the conductance. However, traditional methods that use microscopes for determining multi-probe positions often impose significant constraints on experimental setups. In some cases, installing a microscope is not even feasible. Therefore, in this study, we propose a novel method to determine probe positions using electrical signals from the probes. This method enables precise determination of probe positions using a reference sheet and reference probes, even at low or high temperatures and under ultra-high vacuum or high-pressure conditions. The proposed method simplifies the integration of microscale multi-probe measurement systems into various devices, thereby advancing research on thin films and surfaces.